Chinese Optics Letters, Volume. 11, Issue s1, S10205(2013)

Anti-reflection coating at 550 nm fabricated by atomic layer deposition

Yanghui Li, Weidong Shen, Yueguang Zhang, Xiang Hao, Huanhuan Fan, and Xu Liu

Trimethylamine (TMA), TiCl4, and water are applied as the precursors to deposit Al2O3 and TiO2. With different substrate temperatures, the optical properties and surface morphologies of the two oxides TiO2 and SiO2 are studied, respectively. With substrate temperature of 120 oC, amorphous TiO2 can be obtained, and the surface roughness (RMS) is only 0.928 nm. Applying Al2O3 and TiO2 deposited in 120 oC as low and high refractive index materials, anti-reflection (AR) coating at single point (550 nm) is designed. Furthermore, with the calibrated growth rates, this AR coating is fabricated, and its ultimate reflectance for the AR coating at 550 nm is less than 0.2%, which can meet the requirement for most applications.

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Yanghui Li, Weidong Shen, Yueguang Zhang, Xiang Hao, Huanhuan Fan, Xu Liu. Anti-reflection coating at 550 nm fabricated by atomic layer deposition[J]. Chinese Optics Letters, 2013, 11(s1): S10205

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Paper Information

Category: Deposition and process control

Received: Dec. 12, 2012

Accepted: Dec. 27, 2012

Published Online: May. 30, 2013

The Author Email:

DOI:10.3788/col201311.s10205

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