Opto-Electronic Engineering, Volume. 47, Issue 8, 190581(2020)
In-situ deflectometric measurement of optical surfaces for precision manufacturing
Get Citation
Copy Citation Text
Zhang Xiangchao, Xu Min. In-situ deflectometric measurement of optical surfaces for precision manufacturing[J]. Opto-Electronic Engineering, 2020, 47(8): 190581
Category: Article
Received: Sep. 20, 2019
Accepted: --
Published Online: Oct. 28, 2020
The Author Email: Xiangchao Zhang (zxchao@fudan.edu.cn)