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Acta Optica Sinica, Volume. 22, Issue 3, 379(2002)

Reflectivity Calibration of Soft X-Ray Planar Mirror in the BSRF

[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, [in Chinese]2, and [in Chinese]2
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    [2] [2] Heinle R A, Tirse1l K G. Filtered-mirror sub-keV X-ray measurement system. Laser Program Annual Report,1979,5.5～5.7

    [7] [7] Cui Congwu, Cui Minqi, Zhu Peiping et al.. The measuring system for soft X-ray absolute intensity and its calibration. High Energy Physics and Nuclear Physics, 1998, 22(2):180

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Reflectivity Calibration of Soft X-Ray Planar Mirror in the BSRF[J]. Acta Optica Sinica, 2002, 22(3): 379

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    Paper Information

    Category: Rapid communications

    Received: Dec. 21, 2000

    Accepted: --

    Published Online: Aug. 8, 2006

    The Author Email:

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology