Electro-Optic Technology Application, Volume. 25, Issue 3, 53(2010)

Research on Illumination Measuring System for Mask Projection Stereolithography

TAN Dong-cai... XU Guang-shen, LUO Sheng and JIN Jing |Show fewer author(s)
Author Affiliations
  • [in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    TAN Dong-cai, XU Guang-shen, LUO Sheng, JIN Jing. Research on Illumination Measuring System for Mask Projection Stereolithography[J]. Electro-Optic Technology Application, 2010, 25(3): 53

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 10, 2010

    Accepted: --

    Published Online: Aug. 3, 2010

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics