Spectroscopy and Spectral Analysis, Volume. 36, Issue 11, 3720(2016)
A Research on Filed-of-View (FOV) Widening and Thermal-Phase-Drift (TPD) Compensating Technology Applied in a Polarized Interference Imaging Spectrometer (PIIS)
References(6)
[1] [1] Casasent David, Psaltis Demetri. Applied Optics, 1980, 19(12): 2034.
[2] [2] Smith W L, Zhou D K, Harrison F W, et al. Proc. SPIE, 2001, 4151: 94.
[8] [8] Murphy M T, Udem T, Holzwarth R, et al. Monthly Notices of the Royal Astronomical Society, 2007. 839.
[9] [9] John Howard, Jinil Chung. Review of Scientific Instruments, 2012, 83(10): 10.
[10] [10] John Howard. J. Phys. B: At. Mol. Opt. Phys., 2010, 43(14): 4075.
[12] [12] Zhou Xuetie, Li Yan, Wang Junde, et al. IEEE Trans. Plasma Science, 2001, 29(2): 360.
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ZHAI Yang, XIAO Dong, LI Bo, ZHU Ri-hong. A Research on Filed-of-View (FOV) Widening and Thermal-Phase-Drift (TPD) Compensating Technology Applied in a Polarized Interference Imaging Spectrometer (PIIS)[J]. Spectroscopy and Spectral Analysis, 2016, 36(11): 3720
Paper Information
Received: Jun. 11, 2015
Accepted: --
Published Online: Dec. 30, 2016
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