Infrared and Laser Engineering, Volume. 51, Issue 3, 20210400(2022)
Improving the measurement accuracy of refractive index of GaAs and Sapphire Crystal by laser feedback interferometry
Fig. 1. System for measuring based on laser feedback interferometry. ML: Nd:YVO4 microchip laser; BS: Beam splitter; PD: Photodetector; AOM1 and AOM2: Acousto-optic modulators; L1 and L2: Lens; W: Wollaston prism. MR: Reference mirror; S: Material; ME: Measurement mirror
Fig. 2. Schematic diagram of optical path for differential frequency shift of acousto-optic modulators. ①~⑧: Eight output laser beams
Fig. 4. (a) Theoretical and experimental data of optical path change of two materials with angle of rotation; (b) Difference between theoretical fit data and experimental data
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Chunyu Yuan, Yang Cao, Yong Deng, Shulian Zhang. Improving the measurement accuracy of refractive index of GaAs and Sapphire Crystal by laser feedback interferometry[J]. Infrared and Laser Engineering, 2022, 51(3): 20210400
Category: Photoelectric measurement
Received: Jun. 15, 2021
Accepted: --
Published Online: Apr. 8, 2022
The Author Email: Zhang Shulian (zsl-dpi@tsinghua.edu.cn)