Refractive Index Sensing Imaging Technology Based on Optical Surface Wave

Chonglei Zhang; Ziqiang Xin; Changjun Min; Xiaocong Yuan

doi:10.3788/AOS201939.0126009

Acta Optica Sinica, Volume. 39, Issue 1, 0126009(2019)

Refractive Index Sensing Imaging Technology Based on Optical Surface Wave

Chonglei Zhang^*, Ziqiang Xin, Changjun Min, and Xiaocong Yuan^*

Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology, Shenzhen University, Shenzhen, Guangdong 518060, China

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Chonglei Zhang, Ziqiang Xin, Changjun Min, Xiaocong Yuan. Refractive Index Sensing Imaging Technology Based on Optical Surface Wave[J]. Acta Optica Sinica, 2019, 39(1): 0126009

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Paper Information

Category: Physical Optics

Received: Sep. 29, 2018

Accepted: Oct. 30, 2018

Published Online: May. 10, 2019

The Author Email:

DOI:10.3788/AOS201939.0126009

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology