Acta Optica Sinica, Volume. 39, Issue 1, 0126009(2019)

Refractive Index Sensing Imaging Technology Based on Optical Surface Wave

Chonglei Zhang*, Ziqiang Xin, Changjun Min, and Xiaocong Yuan*
Author Affiliations
  • Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology, Shenzhen University, Shenzhen, Guangdong 518060, China
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    The principle of surface wave, classification of measurement technology and key technology are discussed. The historical developments of refractive index sensing based on total internal reflection, surface plasmon resonance, graphene and other optical surface waves is summarized. The technical advantages of surface wave refractive index sensing imaging are further discussed. The research results show that surface wave sensing imaging, as a high-precision quantitative label-free microscopic imaging technology, has important values in the accurate diagnosis and treatment of medical optics.

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    Chonglei Zhang, Ziqiang Xin, Changjun Min, Xiaocong Yuan. Refractive Index Sensing Imaging Technology Based on Optical Surface Wave[J]. Acta Optica Sinica, 2019, 39(1): 0126009

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    Paper Information

    Category: Physical Optics

    Received: Sep. 29, 2018

    Accepted: Oct. 30, 2018

    Published Online: May. 10, 2019

    The Author Email:

    DOI:10.3788/AOS201939.0126009

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