Infrared and Laser Engineering, Volume. 45, Issue 6, 633001(2016)

Non-linear correction of area CMOS sensor in polarization imaging system

Fu Yifan1、*, Wu Jian1, and He Honghui2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(10)

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    [9] [9] Dong Jianting, Yang Xiaole, Dong Jie. Performance test and image processing of area CMOS image sensor[J]. Infrared and Laser Engineering, 2013, 42(12): 3396-3401. (in Chinese)

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    [1] Li Huagui, Li Yanqiu, Zheng Meng. Scattering characteristics of epithelial tissues by sphere-rotation ellipsoid model[J]. Infrared and Laser Engineering, 2018, 47(2): 217004

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    Fu Yifan, Wu Jian, He Honghui. Non-linear correction of area CMOS sensor in polarization imaging system[J]. Infrared and Laser Engineering, 2016, 45(6): 633001

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    Paper Information

    Category: 生物光子学

    Received: Oct. 5, 2015

    Accepted: Nov. 3, 2015

    Published Online: Jul. 26, 2016

    The Author Email: Yifan Fu (fuyf14@mails.tsinghua.edu.cn)

    DOI:10.3788/irla201645.0633001

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