Nondestructive Measurement of SSC in Western Pear UsingGenetic Algorithms and FT-NIR Spectroscopy

WANG Jia-hua; PAN Lu; SUN Qian; LI Peng-fei; HAN Dong-hai

doi:10.3964/j.issn.1000-0593(2009)03-0678-04

Spectroscopy and Spectral Analysis, Volume. 29, Issue 3, 678(2009)

Nondestructive Measurement of SSC in Western Pear UsingGenetic Algorithms and FT-NIR Spectroscopy

WANG Jia-hua^*, PAN Lu, SUN Qian, LI Peng-fei, and HAN Dong-hai

Author Affiliations

[in Chinese]

show less

References(10)

[6] [6] Chen D,Cai W,Shao X.Analytica Chimica Acta,2007,598:19.

[7] [7] Zou X,Zhao J,Huang X,et al.Chemometrics and Intelligent Laboratory Systems,2007,87:43.

[8] [8] Holland J H.Adaptation in Natural and Artificial Systems,University of Michigan Press,Ann Arbor,MI,1975.

[9] [9] Chen Q,Zhao J,Zhang H,et al.Journal of Near Infrared Spectroscopy,2005,13:327.

[10] [10] Arcos M J,Ortiz Villahoz Belen M C,Sarabia L A.Anal.Chim.Acta,1997,339:63.

[11] [11] Li T H,Lucasius C B,Kateman G.Anal.Chim.Acta,1992,268:123.

[12] [12] Bangalore A S,Shaffer R E,Small G W.Anal.Chem.,1996,68:4200.

[13] [13] Brandye M.Smith,Paul J.Gemperline.Anal.Chim.Acta,2000,423:167.

[15] [15] Yibin Ying,Yande Liu.Journal of Food Engineering,2008,84:206.

[17] [17] Barnes R J,Dhanoa S,Lister J.Appl.Spectrosc.,1989,43(5):772

CLP Journals

[1] Dong Yongfang, Meng Yaoyong, Zhang Pingli, Wen Wei, Li Na. Accurate Age Estimation of Bloodstains Based on Visible Reflectance and Genetic Algorithm Interval Partial Least Squares[J]. Acta Optica Sinica, 2015, 35(8): 830001

Tools

Get Citation

Copy Citation Text

WANG Jia-hua, PAN Lu, SUN Qian, LI Peng-fei, HAN Dong-hai. Nondestructive Measurement of SSC in Western Pear UsingGenetic Algorithms and FT-NIR Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2009, 29(3): 678

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Received: Oct. 8, 2007

Accepted: --

Published Online: Dec. 15, 2009

The Author Email: Jia-hua WANG (w.jiahua@163.com)

DOI:10.3964/j.issn.1000-0593(2009)03-0678-04

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology