Optics and Precision Engineering, Volume. 22, Issue 1, 69(2014)
Accurate measurement of coating thickness for alkali vapor cells based on frustrated total internal reflection
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QUAN Wei, LIU Yang, CHEN Yao. Accurate measurement of coating thickness for alkali vapor cells based on frustrated total internal reflection[J]. Optics and Precision Engineering, 2014, 22(1): 69
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Received: Aug. 9, 2013
Accepted: --
Published Online: Feb. 18, 2014
The Author Email: Wei QUAN (quanwei@buaa.edu.cn)
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