Acta Optica Sinica, Volume. 20, Issue 6, 792(2000)

Phase-Measuring Profilometry in Big Scale Measurement

[in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Phase-Measuring Profilometry in Big Scale Measurement[J]. Acta Optica Sinica, 2000, 20(6): 792

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    Paper Information

    Category: Fourier optics and signal processing

    Received: Dec. 28, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

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