Laser & Optoelectronics Progress, Volume. 49, Issue 9, 91404(2012)
Long-Term Aging and Failure Analysis for 980 nm Laser Diodes
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Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 91404
Category: Lasers and Laser Optics
Received: Mar. 5, 2012
Accepted: --
Published Online: Jul. 13, 2012
The Author Email: Bin Liu (rays_liu@126.com)