Laser & Optoelectronics Progress, Volume. 49, Issue 9, 91404(2012)

Long-Term Aging and Failure Analysis for 980 nm Laser Diodes

Liu Bin1、*, Liu Yuanyuan2, and Cui Bifeng3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    References(13)

    [1] [1] B. Pedersen, B. A. Thompson, S. Zemon et al.. Power requirements for erbium-doped fiber amplifiers pumped in 800, 980, and 1480 nm bands [J]. IEEE Photon. Technol. Lett., 1992, 4(1): 46~49

    [2] [2] M. Fukuda, M. Okayasu, J. Temmyo et al.. Degradation behavior of 0.98-μm strained quantum well InGaAs/AlGaAs lasers under high-power operation [J]. IEEE J. Quantum Electron., 1994, 30(2): 471~476

    [3] [3] A. Moser, A. Oosenbrug, E. E. Latta et al.. High-power operation of strained InGaAs/AlGaAs single quantum well lasers [J]. Appl. Phys. Lett., 1991, 59(21): 2642~2644

    [4] [4] M. Okayasu, M. Fukuda, T. Takeshita et al.. Facet oxidation of InGaAs/GaAs strained quantum-well lasers [J]. J. Appl. Phys., 1991, 69(12): 8346~8351

    [5] [5] Chong Feng, Wang Jun, Xiong Cong et al.. An asymmetric broad waveguide structure for a 0.98-μm high-conversion-efficiency diode laser [J]. J. Semiconductors, 2009, 30(6): 64~67

    [6] [6] A. V. Syrbu, V. P. Yakovlev, G. I. Suruceanu et al.. ZnSe-facet-passivated InGaAs/InGaAsP/InGaP diode lasers of high CW power and “wallplug” efficiency [J]. Electron. Lett., 1996, 32(4): 352~353

    [7] [7] J. E. Ungau, N. S. K. Kwong, S. W. Oh et al.. High power 980 nm nonabsorbing facet lasers [J]. Electron. Lett., 1994, 30(21): 1766~1767

    [8] [8] M. Sagawa, K. Hiramoto, T. Toyonaka et al.. High power COD-free operation of 0.98 μm InGaAs/GaAs/InGaP lasers with non-injection regions near the facets [J]. Electron. Lett., 1994, 30(17): 1410~1411

    [9] [9] Fang Gaozhan, Xiao Jianwei, Ma Xiaoyu et al.. High power GaAs/AlGaAs(λ=808 nm) laser diode arrays with non-injection regions near the facets [J]. High Technology Letters, 2000, 10(12): 9~11

    [10] [10] U. Zeimer, E. Nebauer. High-resolution X-ray diffraction investigations of He-implanted GaAa [J]. Semicond. Sci. Technol., 2000, 15(10): 965~970

    [11] [11] S. Ahmed, R. Gwilliam, B. J. Sealy. Ion-beam-induced isolation of GaAs layers by 4He+ implantation: effects of hot implants [J]. Semicond. Sci. Technol., 2001, 16(10): L64~L67

    [12] [12] Liu Bin, Zhang Jingming, Ma Xiaoyu et al.. The investigation of 980 nm ridge waveguide lasers with current non-injection regions by proton implantation [J]. Laser & Infrared, 2003, 33(2): 109~111

    [13] [13] Liu Bin, Zhang Jingming, Ma Xiaoyu et al.. Investigation of 980 nm ridge waveguide lasers with current non-injection regions by He ion implantation [J]. J. Semiconductors, 2003, 24(3): 234~237

    CLP Journals

    [1] Lin Tao, Sun Hang, Zhang Haoqing, Lin Nan, Ma Xiaoyu, Wang Yonggang. Present Status of Impurity Free Vacancy Disordering Research and Application[J]. Laser & Optoelectronics Progress, 2015, 52(3): 30003

    [2] Liu Bin, Liu Yuanyuan. 808 nm GaAs/AlGaAs Laser Diode Bar with Current Non-Injection Areas Near the Facets[J]. Laser & Optoelectronics Progress, 2013, 50(11): 111404

    [3] Wang Lijie, Tong Cunzhu, Tian Sicong, Zeng Yugang, Wu Hao, Qin Li, Wang Lijun. A Study of Characteristics of Asymmetric Bragg Reflection Waveguide Diode Lasers[J]. Laser & Optoelectronics Progress, 2013, 50(9): 91401

    [4] Lin Tao, Zhang Haoqing, Sun Hang, Wang Yonggang, Lin Nan, Ma Xiaoyu. Impurity-Free Vacancy Diffusion Induces Intermixing in GaInP/AlGaInP Quantum Wells Using SiO2 Encapsulation[J]. Laser & Optoelectronics Progress, 2015, 52(2): 21602

    Tools

    Get Citation

    Copy Citation Text

    Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 91404

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Lasers and Laser Optics

    Received: Mar. 5, 2012

    Accepted: --

    Published Online: Jul. 13, 2012

    The Author Email: Bin Liu (rays_liu@126.com)

    DOI:10.3788/lop49.091404

    Topics