Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region

Jianxin Wang; Xianghui Wang; Ming Zeng

doi:10.3788/COL202018.063602

Chinese Optics Letters, Volume. 18, Issue 6, 063602(2020)

Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region

Jianxin Wang¹, Xianghui Wang^1、*, and Ming Zeng²

Author Affiliations

¹Institute of Modern Optics, Tianjin Key Laboratory of Micro-scale Optical Information Science and Technology, Nankai University, Tianjin 300350, China

²School of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China

show less

Cited By

Article index updated: Apr. 3, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 8 article(s) from Web of Science.

The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Jianxin Wang, Xianghui Wang, Ming Zeng. Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region[J]. Chinese Optics Letters, 2020, 18(6): 063602

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Nanophotonics

Received: Jan. 10, 2020

Accepted: Mar. 2, 2020

Posted: Mar. 2, 2020

Published Online: May. 13, 2020

The Author Email: Xianghui Wang (wangxianghui@nankai.edu.cn)

DOI:10.3788/COL202018.063602

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology