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Infrared and Laser Engineering, Volume. 52, Issue 4, 20220790(2023)

Alignment technology for infrared refractive lens based on high performance

Yang Huang, Yinglong Zhao, Shengjie Zhang, Xiaohan Du, and Chao Zhang
Author Affiliations
  • Beijing Institute of Space Mechanics & Electricity, Beijing 100094, China
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    Figures&Tables (14)
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    References (17)
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    Figures & Tables(14)
    (a) Reflected wavefront of sample’s front surface S1; (b) Reflected wavefront of sample’s back surface S2; (c) Transmitted wavefront of sample; (d) Cavity wavefront of test optical path

    Fig. 1. (a) Reflected wavefront of sample’s front surface S1; (b) Reflected wavefront of sample’s back surface S2; (c) Transmitted wavefront of sample; (d) Cavity wavefront of test optical path

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    Refractive index homogeneity of sample Si (a), sample ZnSe (b), sample Ge (c), sample ZnS (d)

    Fig. 2. Refractive index homogeneity of sample Si (a), sample ZnSe (b), sample Ge (c), sample ZnS (d)

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    Model diagram of online device with lens alignment and image quality measurement

    Fig. 3. Model diagram of online device with lens alignment and image quality measurement

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    Schematic diagram of iterative adjustment position

    Fig. 4. Schematic diagram of iterative adjustment position

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    Schematic diagram of aberration effect on system wavefront

    Fig. 5. Schematic diagram of aberration effect on system wavefront

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    Schematic diagram of system wavefront compensation

    Fig. 6. Schematic diagram of system wavefront compensation

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    Schematic diagram of the relationship between wave aberration and incident angle

    Fig. 7. Schematic diagram of the relationship between wave aberration and incident angle

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    Optical structure diagram of infrared lens

    Fig. 8. Optical structure diagram of infrared lens

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    (a) Structure of clamping device; (b) Connection mode between clamping device and lens barrel

    Fig. 9. (a) Structure of clamping device; (b) Connection mode between clamping device and lens barrel

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    • Table 1. Some optical system parameters of infrared lens

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      Table 1. Some optical system parameters of infrared lens

      ElementMaterialThickness/mmAperture/mm
      Optical windowsCaF213.002205
      Lens1Si15.033210
      Lens2Si15.950205
      Lens3Ge13.081160
      Lens4Ge11.367135
      Lens5Si11.616130
      Lens6ZnSe9.612120

    • Table 2. Measurement results of lens image quality after precision centering

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      Table 2. Measurement results of lens image quality after precision centering

      FOVSystem wavefront diagram & MTF (λ=3.39 μm) Zernike coefficients of main aberration terms
      +6.5°First order: k5: −0.074; k6: −0.055; k7: 0.202; k8: 0.024; k9: 0.167. Medium & high order: k10: −0.044; k11: −0.027; k12: 0.159; k14: 0.020; k16: −0.133; k19: 0.091; k20: 0.066; k30: −0.047.
      0°First order: k5: −0.030; k6: −0.009;k7: −0.089; k8: −0.037; k9: 0.149. Medium & high order: k10: −0.057; k11: −0.037; k12: 0.095; k14: 0.030; k16: −0.128; k19:0.111; k20: 0.089; k30: −0.047.
      −6.5°First order: k5: 0.050; k6: −0.062; k7: −0.326; k8: −0.041; k9: 0.127. Medium & high order: k10: −0.168; k11: −0.057; k12: 0.084; k14: 0.058; k16: −0.116; k19: 0.062; k20: 0.084; k30: −0.046.

    • Table 3. Measurement results of lens image quality after iterative adjustment position

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      Table 3. Measurement results of lens image quality after iterative adjustment position

      FOVSystem wavefront diagram & MTF (λ=3.39 μm) Zernike coefficients of main aberration terms
      +6.5°First order: k5: 0.010; k6: 0.007; k7: 0.011; k8: 0.023; k9: 0.029. Medium & high order: k10: 0.015; k11: −0.031; k12: 0.133; k14: 0.032; k16: −0.125; k19: 0.078; k20: 0.073; k30: −0.050.
      0°First order: k5: −0.011; k6: 0.009;k7: −0.032; k8: 0.020; k9: 0.007. Medium & high order: k10: −0.069; k11: −0.058; k12: 0.078; k14: 0.012; k16: −0.118; k19:0.100; k20: 0.084; k30: −0.044.
      −6.5°First order: k5: 0.015; k6: −0.013; k7: −0.015; k8: 0.022; k9: 0.001. Medium & high order: k10: −0.155; k11: −0.046; k12: 0.055; k14: 0.075; k16: −0.118; k19: 0.090; k20: 0.091; k30: −0.041.

    • Table 4. Transmission wavefront measurement result of the repaired optical windows

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      Table 4. Transmission wavefront measurement result of the repaired optical windows

      FOVTransmission wavefront (λ=3.39 μm) Zernike coefficients of medium & high order aberration terms
      0°k10: 0.064; k11: 0.031; k12: −0.080; k14: −0.044; k16: 0.118; k19:- 0.099; k20: −0.073; k30: 0.051.

    • Table 5. Measurement results of lens image quality after surface modification

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      Table 5. Measurement results of lens image quality after surface modification

      FOVSystem wavefront diagram & MTF (λ=3.39 μm) Zernike coefficients of main aberration terms
      +6.5°First order: k5: 0.011; k6: 0.005; k7: 0.015; k8: 0.019; k9: 0.017. Medium & high order: k10: 0.072; k11: 0.004; k12: 0.087; k14: −0.007; k16: −0.010; k19: −0.025; k20: −0.015; k30: −0.007.
      0°First order: k5: −0.009; k6: 0.014;k7: −0.021; k8: 0.018; k9: 0.005. Medium & high order: k10: −0.007; k11: −0.023; k12: −0.005; k14: −0.030; k16: −0.006; k19:0.007; k20: 0.009; k30: 0.004.
      −6.5°First order: k5: 0.012; k6: −0.015; k7: −0.017; k8: 0.015; k9: 0.002. Medium & high order: k10: −0.095; k11: −0.019; k12: −0.029; k14: 0.035; k16: −0.007; k19: −0.007; k20: 0.027; k30: 0.006.
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    Yang Huang, Yinglong Zhao, Shengjie Zhang, Xiaohan Du, Chao Zhang. Alignment technology for infrared refractive lens based on high performance[J]. Infrared and Laser Engineering, 2023, 52(4): 20220790

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    Paper Information

    Category: Optical fabrication

    Received: Nov. 3, 2022

    Accepted: --

    Published Online: Jul. 4, 2023

    The Author Email:

    DOI:10.3788/IRLA20220790

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology