Laser & Optoelectronics Progress, Volume. 60, Issue 8, 0811034(2023)

[in Chinese]

Hailing Hu1,3,5, Renji He1,3, Yang Chen1,3,5, Peiqing Zhang2,3,5, Xiang Shen2,3,4,5, Da Shixun2,3,5, and Baoan Song1,3,5、*
Author Affiliations
  • 1Faculty of Electrical Engineering and Computer Science, Ningbo University, Ningbo 315211, Zhejiang, China
  • 2The Research Institute of Advanced Technologies, Ningbo University, Ningbo 315211, Zhejiang, China
  • 3Key Laboratory of Photoelectric Detecting Materials and Devices of Zhejiang Province, Ningbo 315211, Zhejiang, China
  • 4Ningbo Institute of Oceanography, Ningbo University, Ningbo 315211, Zhejiang, China
  • 5Engineering Research Center for Advanced Infrared Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, Zhejiang, China
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    Figures & Tables(9)
    Principle of fringe compounding
    Principle of digital π phase shift. (a) Median points before and after interpolation; (b) symmetry transform and remove DC component
    Simulation of DFDM. (a) Measured object; (b) deformed composite fringe; (c) spectrum distribution; (d) low-frequency deformed fringe extracted via Filter 1; (e) high-frequency deformed fringe extracted via Filter 2; (f) extracted high-frequency Moiré fringe (sine); (g) extracted high-frequency Moiré fringe (cosine); (h) reconstructed result
    Spectrum analysis. (a1)-(d1) Spectrum distribution of different frequency fringes; (a2)-(d2) spectrum distribution after removing the DC of Fig. 4 (a1)-(d1)
    Experiment of DFDM. (a) Deformed composite fringe; (b) spectrum distribution; (c) low-frequency deformed fringe extracted via Filter 1; (d) high-frequency deformed fringe extracted via Filter 2; (e) spectrum distribution of AC component in Fig. 6(c); (f) extracted high-frequency Moiré fringe (sine); (g) extracted high-frequency Moiré fringe (cosine); (h) reconstructed face mask
    Comparison of results obtained by OMCGMP and DFDM. (a1) Deformed pattern using OMCGMP at low-frequency; (a2) deformed pattern using OMCGMP at high-frequency; (b) deformed pattern using DFDM; (c1) reconstructed result using OMCGMP at low-frequency; (c2) reconstructed result using OMCGMP at high-frequency; (d) reconstructed result using DFDM
    Error analysis of results measured using OMCGMP and DFDM. (a) Cutaway view at line 240 with Figs. 6(c1) and 6(d), and the reconstructed result obtained by 16-PSP; (b) cutaway view at line 406 with Figs. 6(c1) and 6(d), and the reconstructed result obtained by 16-PSP; (c) cutaway view at column 350 with Figs. 6(c1) and 6(d), and the reconstructed result obtained by 16-PSP
    Results of space-isolated objects reconstructed using DFDM. (a) Deformed composite pattern of space-isolated objects; (b) reconstructed result of Fig. 8(a); (c) cutaway view at line 345 with Fig. 8 (b) and the reconstructed result obtained by 16-PSP
    • Table 1. Experimental comparison results between OMCGMP and DFDM

      View table

      Table 1. Experimental comparison results between OMCGMP and DFDM

      MethodReference fringe patternDeformed fringe patternRMSE /mm
      OMCGMP410.1694
      DFDM110.0737
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    Hailing Hu, Renji He, Yang Chen, Peiqing Zhang, Xiang Shen, Da Shixun, Baoan Song. [J]. Laser & Optoelectronics Progress, 2023, 60(8): 0811034

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    Paper Information

    Category: Imaging Systems

    Received: Sep. 30, 2022

    Accepted: Oct. 24, 2022

    Published Online: Apr. 13, 2023

    The Author Email: Song Baoan (songbaoan@nbu.edu.cn)

    DOI:10.3788/LOP222658

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