[1] R Volkmer. Thermal characteristics of the solar telescope GREGOR, 7012, 220-228(2008).

[2] S S Hasan, D Soltau, H Karcher et al. NLST: the indian national large solar telescope, 7733, 215-226(2010).

[3] X C Hu, J Q Peng, B Zhang. Thermal distortion of deformable mirror and its influence on beam quality. Chinese Journal of Lasers, 42, 45-53(2015).

[4] Y Y Du, J Z An, X J Shu. Effect of thermal distortion of mirror on characteristics of laser beam in unstable resonator. High Power Laser and Particle Beams, 20, 1333-1338(2008).

[5] Z J Liu, P Zhou, X J Xu. Study on universal standard for evaluating high energy beam quality. Chinese Journal of Lasers, 36, 773-778(2009).

[6] J C Jia, Y K Zhong, Z Z Zhang et al. Wafer temperature monitoring technology in the integrated circuit manufacturing process. Chinese Journal of Scientific Instrument, 42, 15-29(2021).

[7] S M Yang, W Q Tao. Heat transfer, 367-368(2006).

[8] C Mitra, A Banerjee, S Maity et al. An optical method for measuring metal surface temperature in Harsh environment conditions, 7726, 384-391(2010).

[9] Z Yang, S C Zhang, L Yang. Calculation of infrared temperature measurement on non-lambertian objects. Spectroscopy and Spectral Analysis, 30, 2093-2097(2010).

[10] S Q Chen, H S Chen. Influence and analysis of surface material to veracity of measuring temperature by using infrared thermal image instruments. Experimental Technology and Management, 25, 41-43(2008).

[11] C K Hsieh, W A Ellingson. A quantitative determination of surface temperatures using an infrared camera. Metal Science and Heat Treatment, 21, 346-349(1979).

[12] C Monte, B Gutschwager, S P Morozova et al. Radiation thermometry and emissivity measurements under vacuum at the PTB. International Journal of Thermophysics, 30, 203-219(2009).

[13] P Alexa, J Solař, F Čmiel et al. Infrared thermographic measurement of the surface temperature and emissivity of glossy materials. Journal of Building Physics, 41, 533-546(2018).

[14] V C Raj, S V Prabhu. Measurement of surface temperature and emissivity of different materials by two-colour pyrometry. Review of Scientific Instruments, 84, 124903(2013).

[15] M D Drury, K P Perry, T Land. Pyrometers for surface-temperature measurement. Journal of the Iron and Steel Institute, 169, 245-250(1951).

[16] H B Becker, T F Wall. Effect of specular reflection of hemispherical surface pyrometer on emissivity measurement. Journal of Physics E: Scientific Instruments, 14, 998-1001(1981).

[17] R E Bedford, C K Ma, Z X Chu et al. Calculation of the radiant characteristics of a plane diffuse surface covered by a specular hemisphere. Journal of Physics E: Scientific Instruments, 21, 785-791(1988).

[18] S J Huang, X M Cheng, T Zhang et al. A shielding method and device for high reflectivity infrared radiation measurement. China.

[19] X P Hao, J Song, M Xu et al. Vacuum radiance-temperature standard facility for infrared remote sensing at NIM. International Journal of Thermophysics, 39, 1-14(2018).

[20] Z Yang, L Yang. Calculation and error analysis of infrared temperature measurement using reflected temperature compensation. Optical Technique, 34, 154-156(2008).

[21] Z Yang, S C Zhang, L Yang. Reflection temperature compensation method and its experimental verification. Optical Precision Engineering, 18, 1959-1964(2010).

[22] S L Wei, L W Han, F Y Cheng. Compensation algorithm to improve the influence of ambient light on the infrared temperature measurement accuracy of a strong reflector surface. Infrared Technology, 42, 1179-1184(2020).

[23] S L Wei, J S Wang, L W Han. Algorithm of compensation infrared temperature measurement error on strong reflector. Laser＆Infrared, 49, 187-193(2019).

[24] D Höser, R Wallimann, P R Von Rohr. Uncertainty analysis for emissivity measurement at elevated temperatures with an infrared camera. International Journal of Thermophysics, 37, 1-17(2016).

[25] Optis pi. M shortwave infrared cameras. (Last revised. http://optris.com.cn/thermal -imager-optris-pi-1m

[28] C G Zhang. The research of infrared radiation temperature measurement key techniques(2013).

[30] B Müller, U Renz. Development of a fast fiber-optic two-color pyrometer for the temperature measurement of surfaces with varying emissivities. Review of Scientific Instruments, 72, 3366-3374(2001).

[31] S B Hosseini, T Beno, S Johansson et al. A methodology for temperature correction when using two-color pyrometers-compensation for surface topography and material. Experimental Mechanics, 54, 369-377(2014).

[32] D Lowe, G Machin, M Sadli. Correction of temperature errors due to the unknown effect of window transmission on ratio pyrometers using an in situ calibration standard. Measurement, 68, 16-21(2015).

[33] W N Ke, D Q Zhu, G B Cai. Simulation and analysis of spectral emissivity of metal. Acta Aeronautica ET Astronautica Sinica, 31, 2139-2145(2010).

[34] X J Che. Development of blackbody converting-type method and instrument for precise measurement of surface temperature(2017).

[37] Z J Yang, J M Dai, Y Lin et al. A multi-spectral pyrometer for measuring cathode temperature field of vacuum arc plasma discharge. Spectroscopy and Spectral Analysis, 41, 60-64(2021).

[38] J M Dai. Study of the technique of multi-spectral radiation thermometry(1995).

[39] J M Dai, M H Yang, Z X Chu. Multi-wavelength pyrometer and its application. Journal of Infrared and Millimeter Waves, 14, 461-466(1995).

[40] J M Dai. Survey of radiation thermometry. Techniques of Automation &Applications, 23, 1-7(2004).

[41] Z T Wang, J M Dai, S Yang. Research on a multispectral thermal imager for true temperature field measurement of explosion flames. Spectroscopy and Spectral Analysis, 43, 3885-3890(2023).

[42] K Ujihara. Reflectivity of metals at high temperatures. Journal of Applied Physics, 43, 2376-2383(1972).

[43] D L Decker, V A Hodgkin. Wavelength and temperature dependence of the absolute reflectance of metals at visible and infrared wavelengths. Natl. Bur. Stand. US Spec. Publ, 620, 190-200(1981).

[44] X M Li, H M Jiang, T Y Zhang. Reflectivity change of 45# steel at 3.8 μm under 915 nm laser irradiation. Laser & Optoelectronics Progress, 54, 071401(2017).

[45] C Long, J Y Chen, Y C Yang. Temperature dependence of reflectance and irradiation of the ground metallic target. Chinese Journal of Luminescence, 37, 1566-1570(2016).

[46] H Y Jia, J M Zhao, Y X Sun et al. A method for measuring the cavity surface temperature of a semiconductor laser. China.

[47] S Krenek, K Anhalt, A Lindemann et al. A study on the feasibility of measuring the emissivity with the laser-flash method. International Journal of Thermophysics, 31, 998-1010(2010).

[48] T Iuchi, T Furukawa. Some considerations for a method that simultaneously measures the temperature and emissivity of a metal in a high temperature furnace. Review of Scientific Instruments, 75, 5326-5332(2004).

[49] T Iuchi, A Gogami. Simultaneous measurement of emissivity and temperature of silicon wafers using a polarization technique. Measurement, 43, 645-651(2010).

[50] G Machin, K Anhalt, M Battuello et al. The European project on high temperature measurement solutions in industry (HiTeMS)–a summary of achievements. Measurement, 78, 168-179(2016).

[51] X J Che, Z Xie. Surface tmperature measurement with unknown emissivity using a two-color Pyrometer placed with a reflector, 398, 012005(2018).

[52] C C Yao, X S Ge, S X Cheng et al. The research on a new kind of blackbody radiation source. Journal of Engineering Thermophysics, 12, 164-168(1991).

[53] P Zhang. A study of the system error of surface pyrometer. Journal of Infrared and Millimeter Waves, 5, 164-168(1986).

[54] S F Turner, S F Metcalfe, A Mellor et al. Accurate thermal imaging of low-emissivity surfaces using approximate blackbody cavities, 8354, 309-316(2012).

[55] Y Song. Study of spectral emissivity on-line measurement technology(2009).

[56] X J Che, Z Xie. Development of ReFaST pyrometer for measuring surface temperature with unknown emissivity: Methodology, implementation, and validation. IEEE Transactions on Instrumentation and Measurement, 66, 1845-1855(2017).

[57] J C Krapez, C Belanger, P Cielo. A double-wedge reflector for emissivity enhanced pyrometry. Measurement Science and Technology, 1, 857-864(1990).

[58] P G Cielo, J C Krapez, M Lamontagne et al. Conical-cavity fiber optic sensor for temperature measurement in a steel furnace. Optical Engineering, 32, 486-493(1993).

[59] J C Krapez, P G Cielo, M Lamontagne. Reflecting-cavity IR temperature sensors: an analysis of spherical, conical, and double-wedge geometries. Proc. SPIE, 1320, 186-201(1990).

[60] S J Huang, L X Wang, X Hu et al. Research on accurate non-contact temperature measurement method for telescope mirror. Optics Express, 31, 21521-21541(2023).

[61] G R Peacock. Review of noncontact process temperature measurements in steel manufacturing, 3700, 171-189(1999).

[62] I Ridley, T G R Beynon. Infrared temperature measurement of bright metal strip using multiple reflection in a roll-strip wedge to enhance emissivity. Measurement, 7, 171-176(1989).

[63] D Terada, R Takigawa, T Iuchi. Automatically emissivity-compensated radiation thermometry, 1065, 122008(2018).

[64] C X Zhu, M J Hobbs, J R Willmott. An accurate instrument for emissivity measurements by direct and indirect methods. Measurement Science and Technology, 31, 044007(2020).

[65] C X Zhu. Design and realisation of high accuracy emissivity measurement instruments for radiation thermometry(2019).

[66] J L Wang, Z Xie, X J Che. A novel accuracy validation method of surface temperature measurement by the ReFaST pyrometer. IEEE Transactions on Instrumentation and Measurement, 72, 1-9(2022).

[67] Z Xie, J L Wang, X J Che. Research on the methodology and instrument of traceable measurement of surface temperature based on an “ideal plane” model. AIP Advances, 12, 065009(2022).

[68] K M Gao, H L Liu, W Q Chen. Study on radiation pyrometer preceded with a reflector. Journal of Northeastern University (Natural Science), 5, 39-47(1984).

[69] Z M Zhang, Y H Zhou. An effective emissivity model for rapid thermal processing using the net-radiation method. International Journal of Thermophysics, 22, 1563-1575(2001).

[70] Y H Zhou, Y J Shen, Z M Zhang et al. A Monte Carlo model for predicting the effective emissivity of the silicon wafer in rapid thermal processing furnaces. International Journal of Heat and Mass Transfer, 45, 1945-1949(2002).