Pulsed LD side-pumped MgO: LN electro-optic cavity-dumped 1123 nm Nd: YAG laser with short pulse width and high peak power

Yang Bai; Bing Bai; Diao Li; Yanxiao Sun; Jianlin Li; Lei Hou; Mingxuan Hu; Jintao Bai

doi:10.1017/hpl.2017.38

High Power Laser Science and Engineering, Volume. 6, Issue 1, 010000e4(2018)

Pulsed LD side-pumped MgO: LN electro-optic cavity-dumped 1123 nm Nd: YAG laser with short pulse width and high peak power

Yang Bai^1,2,3、†, Bing Bai^1,2,3, Diao Li^1,2,3, Yanxiao Sun^1,2,3, Jianlin Li^1,2,3, Lei Hou^1,2,3, Mingxuan Hu^1,2,3, and Jintao Bai^1,2,3

Author Affiliations

¹National Key Laboratory of Photoelectric Technology and Functional Materials (Culture Base), Institute of Photonics and Photon-Technology, Northwest University, Xi’an 710069, China

²Shaanxi Engineering Technology Research Center for Solid State Lasers and Application, Xi’an 710069, China

³Provincial Key Laboratory of Photo-electronic Technology, Institute of Photonics and Photon-Technology, Northwest University, Xi’an 710069, China

show less

Cited By

Article index updated:Mar. 8, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 6 article(s) from Web of Science.

Tools

Get Citation

Copy Citation Text

Yang Bai, Bing Bai, Diao Li, Yanxiao Sun, Jianlin Li, Lei Hou, Mingxuan Hu, Jintao Bai. Pulsed LD side-pumped MgO: LN electro-optic cavity-dumped 1123 nm Nd: YAG laser with short pulse width and high peak power[J]. High Power Laser Science and Engineering, 2018, 6(1): 010000e4

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Research Articles

Received: Nov. 12, 2017

Accepted: Dec. 19, 2017

Published Online: Jul. 2, 2018

The Author Email: Yang Bai (by@nwu.edu.cn)

DOI:10.1017/hpl.2017.38

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology