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Acta Optica Sinica, Volume. 22, Issue 2, 249(2002)

Dynamic Argument Using Shift Phase Interferometry

[in Chinese]1、*, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, [in Chinese]2, and [in Chinese]2
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    [3] [3] Andrew Lewis. Measurement of length, surface form and thermal expansion coefficient for length bars up to 1.5 m using multiple wavelength phase stepping interferometry. Meas. Sci. Technol., 1994, 5(6):694～703

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Dynamic Argument Using Shift Phase Interferometry[J]. Acta Optica Sinica, 2002, 22(2): 249

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    Paper Information

    Category: Rapid communications

    Received: Jul. 31, 2000

    Accepted: --

    Published Online: Aug. 8, 2006

    The Author Email: (opticim@mail.njust.edu.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology