Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Laser & Optoelectronics Progress, Volume. 61, Issue 10, 1012004(2024)

Visual Detection Method of Optical Lens Surface Defect Under Dual Light Sources

Shunqin Xu, Lihong Yang*, Qinyue Fu, Qianxi Chen, Xingyuan Li, and Hang Ge
Author Affiliations
  • College of Photoelectric Engineering, Xi'an Technological University, Xi'an, 710021, Shaanxi, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (11)
    Equations (2)
    References (17)
    Tools
    Paper Information
    Topics
    Figures & Tables(11)
    Structure of the critical defect detection device

    Fig. 1. Structure of the critical defect detection device

    Download full size
    Images acquired from the lenses under different illumination. (a) Surface image collected under forward light; (b) surface image collected under backlight

    Fig. 2. Images acquired from the lenses under different illumination. (a) Surface image collected under forward light; (b) surface image collected under backlight

    Download full size
    Telecentric lens imaging features

    Fig. 3. Telecentric lens imaging features

    Download full size
    Two light source illumination modes. (a) Ring-light source illumination mode; (b) parallel backlight source illumination mode

    Fig. 4. Two light source illumination modes. (a) Ring-light source illumination mode; (b) parallel backlight source illumination mode

    Download full size
    Flow chart of image processing

    Fig. 5. Flow chart of image processing

    Download full size
    Images acquired from optical lenses under different light sources. (a) Forward light defect image; (b) backlight defect image

    Fig. 6. Images acquired from optical lenses under different light sources. (a) Forward light defect image; (b) backlight defect image

    Download full size
    Preprocessed defect images. (a) Defects identified in forward light; (b) defects identified in backlight; (c) defects identified after image fusion

    Fig. 7. Preprocessed defect images. (a) Defects identified in forward light; (b) defects identified in backlight; (c) defects identified after image fusion

    Download full size

    • Table 1. Calibration parameters

      View table

      Table 1. Calibration parameters

      Calibration parameters of the imaging system
      A single pixel wide（Sx）/μm3.44961Center point y coordinates（Cy）/pixel1024.02
      A single pixel high（Sy）/μm3.45Medium image wide /pixel2448
      Magnification /times0.801082Medium image high /pixel2048
      X rotation direction /（°）357.985Y rotation direction /（°）358.914
      Center point x coordinates（Cx）/pixel1223.81Z rotation direction /（°）3.24858

    • Table 2. Error analysis

      View table

      Table 2. Error analysis

      NumberDefectZYGO interferometer /μmSystem test /μmError ratio /%
      WidthDiameterWidthDiameter
      1Pitting—17.484—17.6951.206
      2Pitting—7.596—7.3942.659
      3Pitting—42.325—41.9750.826
      4Pitting—53.235—53.2970.116
      5Pitting—96.533—96.5050.029
      6Scratch8.412—8.430—0.214
      7Scratch15.196—15.303—0.704
      8Scratch28.495—28.551—0.196
      9Scratch37.623—37.627—0.011
      10Scratch67.769—67.892—0.181

    • Table 3. Lens defect detection results

      View table

      Table 3. Lens defect detection results

      Detection methodTotal number of defectNumber of pitingNumber of scratch
      Forward light detection15510
      Backlight detection1486
      Image fusion detection251312

    • Table 4. Comparison among system detection results, ZYGO detection results and manual detection results

      View table

      Table 4. Comparison among system detection results, ZYGO detection results and manual detection results

      Detection methodScratch maximum width /μmScratch minimum width /μmPiting maximum diameter /μmPiting minimum diameter /μmTime /s
      System713.80823.80063.29734.0355.327
      ZYGO713.62524.57563.39834.021304.000
      Manual710.00030.00060.00030.000—
    Tools

    Get Citation

    Copy Citation Text

    Shunqin Xu, Lihong Yang, Qinyue Fu, Qianxi Chen, Xingyuan Li, Hang Ge. Visual Detection Method of Optical Lens Surface Defect Under Dual Light Sources[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1012004

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 11, 2023

    Accepted: Oct. 13, 2023

    Published Online: Mar. 20, 2024

    The Author Email: Yang Lihong (yanglihong@xatu.edu.cn)

    DOI:10.3788/LOP232084

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology