Infrared and Laser Engineering, Volume. 52, Issue 5, 20220838(2023)

Study on surface roughness of monocrystalline silicon carbide based on PSD evaluation and pseudo-random tool path

Xin Zhang1, Le Zhang1、*, Chi Song2、*, Lisong Yan3, Xiaolin Yin1, and Binzhi Zhang1
Author Affiliations
  • 1JiHua Laboratory, Foshan 528200, China
  • 2School of Mechatronic Engineering and Automation, Foshan University, Foshan 528225, China
  • 3School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
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    Figures & Tables(8)
    Deterministic tool path. (a) Grating tool path; (b) Helix tool path
    Diagram of a pseudo-random tool path
    Roughness test by Zygo newview 9000 white-light interferometry
    Measurement results of white-light interferometry before machining
    Measurement result of white-light interferometry after grating trajectory processing
    PSD curve calculated by data of grating trajectory
    Roughness result after processing with pseudo-random trajectory
    PSD curve calculated by data of pseudo-random trajectory
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    Xin Zhang, Le Zhang, Chi Song, Lisong Yan, Xiaolin Yin, Binzhi Zhang. Study on surface roughness of monocrystalline silicon carbide based on PSD evaluation and pseudo-random tool path[J]. Infrared and Laser Engineering, 2023, 52(5): 20220838

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    Paper Information

    Category: Material & Thim films

    Received: Oct. 18, 2022

    Accepted: --

    Published Online: Jul. 4, 2023

    The Author Email: Zhang Le (zhangle54@foxmail.com), Song Chi (songchi7787@126.com)

    DOI:10.3788/IRLA20220838

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