Infrared and Laser Engineering, Volume. 52, Issue 5, 20220838(2023)
Study on surface roughness of monocrystalline silicon carbide based on PSD evaluation and pseudo-random tool path
Fig. 1. Deterministic tool path. (a) Grating tool path; (b) Helix tool path
Fig. 3. Roughness test by Zygo newview 9000 white-light interferometry
Fig. 4. Measurement results of white-light interferometry before machining
Fig. 5. Measurement result of white-light interferometry after grating trajectory processing
Fig. 7. Roughness result after processing with pseudo-random trajectory
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Xin Zhang, Le Zhang, Chi Song, Lisong Yan, Xiaolin Yin, Binzhi Zhang. Study on surface roughness of monocrystalline silicon carbide based on PSD evaluation and pseudo-random tool path[J]. Infrared and Laser Engineering, 2023, 52(5): 20220838
Category: Material & Thim films
Received: Oct. 18, 2022
Accepted: --
Published Online: Jul. 4, 2023
The Author Email: Zhang Le (zhangle54@foxmail.com), Song Chi (songchi7787@126.com)