Opto-Electronic Engineering, Volume. 33, Issue 12, 39(2006)

3D measurement technology based on virtual grating of frequency conversion projection

[in Chinese] and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    References(9)

    [1] [1] D.M.MEADOWS,W.O.JOHNSON,J.B.ALLEN.Generation of surface contours by moiré patterns[J].Appl.Opt,1970,9(4):942-947.

    [2] [2] S.Masane,K.Motonori.Application of Moiré topography measurement methods in industry[J].Optic and Laser in Engineering,1998,8(3-4):171-188.

    [3] [3] M.TAKEDA,H.INA,S.KOBAYASHI.Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry[J].J.Opt.Soc.Am,1982,72(1):156-160.

    [4] [4] J.QUIROGA,D.CRESPO,E.BERNABEU.Fourier transform method for automatic processing of moiré deflectograms[J].Opt.Eng,1999,38(6):974-982.

    [5] [5] S.De Nicola,P.Ferraro1,A.Finizio,et al.Fourier transform method of fringe analysis for moiré interferometry[J].SPIE,2000,4016:35-40.

    [6] [6] H.ZHANG,W.CHEN,Y.TAN.Phase unwrapping algorithm for the measurement of three-dimensional object shapes[J].Appl.Opt,1994,33(2):497-504.

    [7] [7] P.G.CHARETTE,I.W.HUNTER.Robust phase-unwrapping method for phase images with high noise content[J].Appl.Opt,1996,135(19):3506-3513.

    [8] [8] R.E.BROOKS,L.O.HEFLINGER.Moiré gauging using optical interference patterns[J].Appl.Opt,1969,8(3):935-939.

    [10] [10] R.CASTANEDA.Moiré in interference with spatial coherence beams[J].SPIE,1999,3749:668-669.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese]. 3D measurement technology based on virtual grating of frequency conversion projection[J]. Opto-Electronic Engineering, 2006, 33(12): 39

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Jan. 14, 2006

    Accepted: --

    Published Online: Nov. 14, 2007

    The Author Email:

    DOI:

    Topics