<trans-title xml:lang="en">A new method for identifying TE<sub>01δ</sub> mode during microwave dielectric measurements of low-loss materials </trans-title>

Lei Li; Han Yan; Xiang-Ming Chen

doi:10.7498/aps.69.20200275

Acta Physica Sinica, Volume. 69, Issue 12, 128401-1(2020)

A new method for identifying TE_01δ mode during microwave dielectric measurements of low-loss materials

Lei Li^*, Han Yan, and Xiang-Ming Chen

Author Affiliations

School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China

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Figures & Tables(6)

Fig. 1. Three steps for identifying TE_01δ-mode resonant mode of to-be-measured sample.

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Fig. 2. |S₂₁| as a function of frequency for to-be-measured samples: (a) S1; (b) S2; (c) S3; (d) S4; (e) S5.

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Fig. 3. (a) TE_01δ-mode resonant peaks for R3 and R3 + S2 in the cavity; (b) |S₂₁| as a function of frequency for only S2 in the cavity.

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Table 1. Dimension and permittivity of references and to-be-measured samples.
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Table 1. Dimension and permittivity of references and to-be-measured samples.
类型编号直径/mm 厚度/mm ε_r
参考试样 R1 10.17 1.64 19.3
R2 10.86 1.48 39.4
R3 10.75 1.49 77.2
R4 9.36 1.04 434
待测试样 S1 12.03 6.51 2.79
S2 9.90 5.10 4.78
S3 10.00 5.00 9.50
S4 10.12 4.67 19.4
S5 10.83 5.44 39.2

Table 2. Measured and calculated resonant frequencies for different reference/to-be-measured sample combinations.

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Table 2. Measured and calculated resonant frequencies for different reference/to-be-measured sample combinations.

参考试样	待测试样	f_0,1/GHz	f_0,2/GHz	f_0,3/GHz	f_0,4/GHz	f_0,5/GHz
R3	S1	5.224	5.184	15.107	14.988	14.642
R3	S2	5.224	5.160	13.862	13.736	14.958
R3	S3	5.224	5.067	10.216	10.158	10.360
R3	S4	5.224	4.849	7.358	7.298	9.035
R3	S5	5.224	4.217	4.830	4.800	8.376

R1	S2	10.046	9.498	13.807	13.736	14.958
R2	S2	7.215	7.028	13.789	13.736	14.958
R4	S2	2.760	2.752	13.830	13.736	14.958

Table 3. Relative errors of TE_01δ-mode resonant frequency and rough permittivity, and measured results of dielectric properties

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Table 3. Relative errors of TE_01δ-mode resonant frequency and rough permittivity, and measured results of dielectric properties

Reference	Sample	(f_0,3 – f_0,4)/ f_{0, 4}	ε_r,rou	ε_r,sam	(ε_r,rou – ε_r,sam)/ε_{r, sam}	tanδ
R3	S1	0.80%	2.73	2.79	–2.2%	1.08 × 10^–4
R3	S2	0.92%	4.68	4.78	–2.1%	2.75 × 10^–4
R3	S3	0.58%	9.38	9.50	–1.3%	2.56 × 10^–5
R3	S4	0.83%	19.1	19.4	–1.5%	7.63 × 10^–5
R3	S5	0.62%	38.7	39.2	–1.3%	1.21 × 10^–4

R1	S2	0.51%	4.72	4.78	–1.2%	2.75 × 10^–4
R2	S2	0.38%	4.74	4.78	–0.8%	2.75 × 10^–4
R4	S2	0.68%	4.70	4.78	–1.8%	2.75 × 10^–4

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Lei Li, Han Yan, Xiang-Ming Chen. A new method for identifying TE_01δ mode during microwave dielectric measurements of low-loss materials [J]. Acta Physica Sinica, 2020, 69(12): 128401-1

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Paper Information

Received: Feb. 24, 2020

Accepted: --

Published Online: Dec. 8, 2020

The Author Email:

DOI:10.7498/aps.69.20200275

Topics

Nuclear physics

Particles and fields

Particle and nuclear astrophysics and cosmology

Table 1. Dimension and permittivity of references and to-be-measured samples.

Table 1. Dimension and permittivity of references and to-be-measured samples.

Table 2. Measured and calculated resonant frequencies for different reference/to-be-measured sample combinations.

Table 2. Measured and calculated resonant frequencies for different reference/to-be-measured sample combinations.

Table 3. Relative errors of TE01δ-mode resonant frequency and rough permittivity, and measured results of dielectric properties

Table 3. Relative errors of TE01δ-mode resonant frequency and rough permittivity, and measured results of dielectric properties

Table 3. Relative errors of TE_01δ-mode resonant frequency and rough permittivity, and measured results of dielectric properties

Table 3. Relative errors of TE_01δ-mode resonant frequency and rough permittivity, and measured results of dielectric properties