Robust hybrid laser linewidth reduction using Si<sub>3</sub>N<sub>4</sub>-based subwavelength hole defect assisted microring reflector

Jiachen Li; Baoyu Zhang; Sigang Yang; Hongwei Chen; Minghua Chen

doi:10.1364/PRJ.412284

Photonics Research, Volume. 9, Issue 4, 558(2021)

Robust hybrid laser linewidth reduction using Si₃N₄-based subwavelength hole defect assisted microring reflector

Jiachen Li^1,2, Baoyu Zhang^1,2, Sigang Yang^1,2, Hongwei Chen^1,2, and Minghua Chen^1,2、*

Author Affiliations

¹Beijing National Research Center for Information Science and Technology (BNRist), Beijing 100084, China

²Department of Electronic Engineering, Tsinghua University, Beijing 100084, China

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Jiachen Li, Baoyu Zhang, Sigang Yang, Hongwei Chen, Minghua Chen. Robust hybrid laser linewidth reduction using Si₃N₄-based subwavelength hole defect assisted microring reflector[J]. Photonics Research, 2021, 9(4): 558

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Paper Information

Category: Integrated Optics

Received: Oct. 12, 2020

Accepted: Feb. 7, 2021

Published Online: Apr. 6, 2021

The Author Email: Minghua Chen (chenmh@tsinghua.edu.cn)

DOI:10.1364/PRJ.412284

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology