Electro-Optic Technology Application, Volume. 36, Issue 2, 50(2021)

Testing Design of CPU Module

TIAN Xiao-bo1、*, TANG Yan1, and YU Shui-you2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(3)

    [1] [1] DERVISOGLU B I. Towards a standard approach for controlling board-level test functions[C]//Proceedings of 1990 International Test Conference, Washington DC: ITC, 1990: 582-590.

    [2] [2] Zipori H, Sa Giv Z, Yossovitch A. Approaches and implementation of software test and development system for embedded computer system [C]//Proceedings of 1988 Third Israel Conference on Computer Systems and Software Engineering, Israel: CCSSE, 1988: 30-39.

    [3] [3] Charles E, Spurgeon Joam Zimnerman. Ethernet: The Definitive Guide, 2016.

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    TIAN Xiao-bo, TANG Yan, YU Shui-you. Testing Design of CPU Module[J]. Electro-Optic Technology Application, 2021, 36(2): 50

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    Paper Information

    Category:

    Received: May. 27, 2020

    Accepted: --

    Published Online: Sep. 13, 2021

    The Author Email: TIAN Xiao-bo (aoe-cetc@cetc.com.cn)

    DOI:

    CSTR:32186.14.

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