INFRARED, Volume. 42, Issue 6, 1(2021)

Research on Minority Carrier Lifetime Measurements of HgCdTe Thin Film

Wei-lin SHE*... Chen SHEN, Qian LI, Ming LIU, Da LI and Jing-xia SHI |Show fewer author(s)
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    References(4)

    [3] [3] Eikelboom J A, Leguijt C, Frumau C F A, et al. Microwave Detection of Minority Carriers in Solar Cell Silicon Wafers[J]. Solar Energy Material and Solar Cells, 1995, 36(2): 169-185.

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    [6] [6] Hahn T, Schmerler S, Hahn S, et al. Interpretation of Lifetime and Defect Spectroscopy Measurements by Generalized Rate Equations[J]. Journal of Materials Science: Materials in Electronics, 2008, 19(2): 79-82.

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    SHE Wei-lin, SHEN Chen, LI Qian, LIU Ming, LI Da, SHI Jing-xia. Research on Minority Carrier Lifetime Measurements of HgCdTe Thin Film[J]. INFRARED, 2021, 42(6): 1

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    Paper Information

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    Received: Jan. 21, 2021

    Accepted: --

    Published Online: Aug. 16, 2021

    The Author Email: Wei-lin SHE (shwl.cn@gmail.com)

    DOI:10.3969/j.issn.1672-8785.2021.06.001

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