Fig. 1. Optical design for far field measurement of focus spot using schlieren method based on diffraction inversion of sidelobe beam

Fig. 2. Flow chart of data processing

Fig. 3. Image of sidelobe beam diffraction inversion

Fig. 3. [in Chinese]

Fig. 4. Angle transformation image

Fig. 5. Parameter detection of sidelobe peak of one-dimensional beam curve in any direction

Fig. 6. Maximum curve rings of each sidelobe peak

Fig. 7. Theoretical one-dimensional curve to detect the parameters of sidelobe peak (Y = 256)

Fig. 8. Detected peak and trough position of one-dimensional sidelobe noise curve (Y = 256)

Fig. 9. All maximum curve rings of each sidelobe peak

Fig. 10. Detected parameters of each sidelobe peak of sidelobe beam in any directions