High Power Laser Science and Engineering, Volume. 3, Issue 3, 03000001(2015)

The European X-ray Free-Electron Laser: toward an ultra-bright, high repetition-rate x-ray source

M. Altarelli*
Author Affiliations
  • European XFEL GmbH, Albert-Einstein-Ring 18, 22761 Hamburg, Germany
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    Figures & Tables(6)
    Schematic representation of the time sequence of both the electron bunches and the x-ray pulses at the European XFEL.
    Schematic representation of the layout of the undulator and photon tunnels and of the instruments at the European XFEL. The linear accelerator is to the left of the figure. The SASE1, SASE2 and SASE3 undulator positions are visible; between the SASE1 and the SASE2 tunnels, the two additional undulator tunnels available for future developments are shown. Far right: the acronyms of the six baseline instruments are explained in Table 3.
    Layout of the European XFEL facility; the path of the underground tunnels is superimposed on a map of the northwest part of Hamburg and the town of Schenefeld in Schleswig–Holstein.
    • Table 1. Basic parameters of the European XFEL.

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      Table 1. Basic parameters of the European XFEL.

      FacilityLCLSSACLA European
      (USA)(Japan)XFEL (SASE1
      undulator)
      Max. electron energy (GeV) 14.3 8.0 17.5
      Min. photon wavelength (nm) 0.15 0.06¡0.05
      Photons/pulse
      Peak brilliance
      Average brilliance
      Pulses/second 120 60 27 000
      Date of first beam 2009 2011 2016
    • Table 2. Target performances of detectors for the European XFEL.

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      Table 2. Target performances of detectors for the European XFEL.

      Detector parameters AGIPD LPDDEPFET sensor with signal compression (DSSC)
      Energy range (keV)3–13 (25)5(1)–20 (25) 0.5–6 (25)
      Dynamic range (photons/pixel/pulse)104 @ 12 keV105 @ 12 keV6000 @ 1 keV
      Single photon sensitivity yes yes yes
      Number of intermediate stored images512
      Pixel size 200 × 200500 × 500236 × 236
    • Table 3. Schematic description of the scientific applications of the six baseline instruments.

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      Table 3. Schematic description of the scientific applications of the six baseline instruments.

      Hard x-raysSASE1SPBSFX: Single particles, clusters and biomolecules – serial femtosecond crystallography (User Consortium): Structural determination of (mostly) biological objects
      FXE: Femtosecond x-ray experiments: time-resolved investigation of ultrafast processes in solids, liquids or gases
      SASE2MID: Materials imaging and dynamics: structure and dynamics determination of disordered systems by coherent scattering and photon correlation spectroscopy
      HED: High energy-density matter: matter under extreme conditions, e.g., in very high fields, high temperature and pressures
      Soft x-raysSASE3SQS: Small quantum systems: investigation of atoms, ions, molecules and clusters in intense fields, nonlinear x-ray optical phenomena
      SCS: Soft x-ray coherent scattering and spectroscopy: electronic and atomic structure, dynamics of nano-systems and non-reproducible biological systems with soft x-rays
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    M. Altarelli. The European X-ray Free-Electron Laser: toward an ultra-bright, high repetition-rate x-ray source[J]. High Power Laser Science and Engineering, 2015, 3(3): 03000001

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    Paper Information

    Special Issue: FREE ELECTRON LASERS

    Received: Jan. 31, 2015

    Accepted: Apr. 29, 2015

    Published Online: Jan. 7, 2016

    The Author Email: M. Altarelli (massimo.altarelli@xfel.eu)

    DOI:10.1017/hpl.2015.17

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