Acta Optica Sinica (Online), Volume. 1, Issue 4, 0404001(2024)

Charge Measurement of Levitated Microspheres in Optical Trap Chip (Invited)

Haining Feng1,2, Shilong Jin1,2, Xinlin Chen1,2、*, Guofeng Li1,2, Siyuan Rao1,2, Weiqing Zeng1,2, Wei Xiong1,2, Xiang Han1,2, Guangzong Xiao1,2, and Hui Luo1,2、**
Author Affiliations
  • 1College of Advanced Interdisciplinary Studies, National University of Defense Technology, Changsha 410073, Hunan , China
  • 2Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, Hunan , China
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    References(34)

    [3] Zhang X, Gao W H, Yang B. Progress in research and application of charge measurement technology[J]. Physics Bulletin, 152-155(2024).

    [4] Zhang Z B, Ren M, Song B et al. Study on subsequent behaviors of partial discharge charges in polymers[J]. High Voltage Engineering, 48, 2215-2225(2022).

    [7] Zhang H M, Xiong W, Han X et al. Research progress in levitated optomechanical sensing technology (invited)[J]. Infrared and Laser Engineering, 52, 20230193(2023).

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    Haining Feng, Shilong Jin, Xinlin Chen, Guofeng Li, Siyuan Rao, Weiqing Zeng, Wei Xiong, Xiang Han, Guangzong Xiao, Hui Luo. Charge Measurement of Levitated Microspheres in Optical Trap Chip (Invited)[J]. Acta Optica Sinica (Online), 2024, 1(4): 0404001

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    Paper Information

    Category: Research Articles

    Received: Jul. 4, 2024

    Accepted: Jul. 23, 2024

    Published Online: Oct. 13, 2024

    The Author Email: Chen Xinlin (xlchencs@163.com), Luo Hui (luohui.luo@163.com)

    DOI:10.3788/AOSOL240438

    CSTR:32394.14.AOSOL240438

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