In a levitated optomechanical system, the electric charge on the captured particle affects the sensitivity of measurements for force, gravity, acceleration, mass, and electric field. In this study, we propose and design a dual-beam optical trap chip with integrated electrodes to measure the charge on trapped particles using both direct current signal-driven electric fields and alternating current signal-driven electric fields. We successfully measure the precise charge of 10 μm diameter silicon dioxide microspheres trapped in the chip using an all-fiber miniaturized system. The results show that both methods yield a charge number of 493 for the silicon dioxide microspheres, confirming the reliability of these charge measurement methods.