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Chinese Optics Letters, Volume. 15, Issue 9, 091401(2017)

Comparison of high-energy multi-pass Ti:sapphire amplifiers with a different Ti-dopant concentration

Zebiao Gan1,2, Xiaoyan Liang1、*, Lianghong Yu1, Jiaqi Hong2,3, Ming Xu3, Ying Hang3, and Ruxin Li1
Author Affiliations
  • 1State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing, 100049, China
  • 3Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    CLP Journals

    [1] He Cao, Zebiao Gan, Xiaoyan Liang, Lianghong Yu, Wenqi Li, Zhen Guo, Pei Huang, Jianye Wang, Min Xu, Yin Hang. Optical property measurements of 235 mm large-scale Ti:sapphire crystal[J]. Chinese Optics Letters, 2018, 16(7): 071401

    Cited By

    [1] Zhen Guo, Lianghong Yu, Wenqi Li, Zebiao Gan, Xiaoyan Liang. Wavefront evolution of the signal beam in Ti:sapphire chirped pulse amplifier. Chinese Physics B, 28, 014203(2019).

    [2] Xi Zou, Fanyu Kong, Yunxia Jin, Peng Chen, Junming Chen, Jiao Xu, Yonglu Wang, Yibin Zhang, Jianda Shao. Influence of nodular defect size on metal dielectric mixed gratings for ultra-short ultra-high intensity laser system. Optical Materials, 91, 177(2019).

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    Zebiao Gan, Xiaoyan Liang, Lianghong Yu, Jiaqi Hong, Ming Xu, Ying Hang, Ruxin Li. Comparison of high-energy multi-pass Ti:sapphire amplifiers with a different Ti-dopant concentration[J]. Chinese Optics Letters, 2017, 15(9): 091401

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Feb. 23, 2017

    Accepted: May. 25, 2017

    Published Online: Jul. 19, 2018

    The Author Email: Xiaoyan Liang (liangxy@siom.ac.cn)

    DOI:10.3788/COL201715.091401

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology