[1] [1] LU Rongsheng，SHI Yanqiong，LI Qi，et al. AOI Techniques for Surface Defect Inspection [J]. Applied Mechanics and Materials(S1660-9336)，2010，36：297-302.

[2] [2] Nakashima K. Hybrid inspection system for LCD color filter panels [C]// Proceedings of the 10th International Conference on Instrumentation and Measurement Technology，Hamamatsu，Japan，May 10–12，1994，2：689–692.

[3] [3] Sokolov S M，Treskunov A S. Automatic vision system for final test of liquid crystal displays [C]// Proceedings of the IEEE International Conference on Robotics and Automation，Nice，France，May 12–14，1992：1578–1582.

[4] [4] OH J H，KWAK D M，LEE K B，et al. Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Threshohding [J]. Key Engineering Materials(S1662-9795)，2004，270/273：233-238.

[5] [5] RYU J S，JONG-HWAN，KIM J G，et al. TFT-LCD panel blob-mura inspection using the correlation of wavelet coefficients [C]// IEEE Region 10 Conference，Chiang Mai，Thailand，Nov 21–24，2004：219-222.

[6] [6] LU Chijie，TSAI Duming. Automatic Defect Inspection for LCDs Using Singular Value Decomposition [J]. International Journal of Advanced Manufacturing Technology(S0268-3768)，2005，25(1/2)：53-61.

[7] [7] TSAI Duming，HUNG Chungyu. Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition [J]. International Journal of Production Research(S0020-7543)，2005，43(21)：4589–4607.

[8] [8] LU Chijie，TSAI Duming. Independent component analysis-based defect detection in patterned liquid crystal display surfaces [J]. Image Vision Computing(S0262-8856)，2008，26(7)：955-970.

[13] [13] TSAI Duming，Hsieh C Y. Automated surface inspection for directional textures [J]. Image Vision Computing(S0262-8856)， 1999，18(1)：49-62.

[14] [14] Gonzalez R C，Woods R E. Digital Image Processing [M]. New Jersey & Upper Saddle River：Pearson Prentice Hall，2008： 220-224.