A Model for 1/f Noise in Optoelectronic Coupled Devices

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Photonica Sinica, Volume. 34, Issue 9, 1359(2005)

[in Chinese]... [in Chinese], [in Chinese], [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)

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References(2)

[1] [1] Dai Y S, Xu J Sh. The noise analysis and noise reliability indicators of optoelectronic coupled devices. Solid-State Electronics, 2000,44(5): 1495～1500

[3] [3] Harder C, Katz, Margalit S, et al. A noise equivalent circuit of a semiconductor laser diode. IEEE J Quant Rlectron, 1982,18(3): 333～341

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[1] WU Xuan-zi, GUO Shu-xu, YANG Chao, GUAN Jian, TIAN Chao, CAO Jun-sheng, GAO Feng-li. The 1/f Noise Correlation of Semiconductor Lasers under Low Bias Current[J]. Acta Photonica Sinica, 2016, 45(6): 614002

[2] ZHANG Wen-wen, CHEN Qian. Noise Characteristics of Electron Multiplying Charge Coupled Devices[J]. Acta Photonica Sinica, 2009, 38(4): 756

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Model for 1/f Noise in Optoelectronic Coupled Devices[J]. Acta Photonica Sinica, 2005, 34(9): 1359

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