Fig. 1. Micro-nano manipulation system: (a) Micro-nano manipulation stage; (b) AFM probe; (c) tungsten probe; (d) CNTs sample.

Fig. 2. Schematic diagram of mechanics during contact.

Fig. 3. Horizontal contact of AFM probe and CNT.

Fig. 4. Circuit for CNT cutting and conductivity measurement.

Fig. 5. Bending deformation of CNT with same L₁ (15 μm) and different L₃: (a), (d) L₃ = 4.10 μm; (b), (e) L₃ = 6.41 μm; (c), (f) L₃ = 8.24 μm.

Fig. 6. Position of CNTs and probes.

Fig. 7. Stretching of CNT with AFM probe

Fig. 8. Contact detection and position judgment.

Fig. 9. Cutting process: (a) Contact of probes and CNT; (b) CNT’s breakdown.

Fig. 10. I-V data of CNT and fitting curve.

Fig. 11. I-V data of CNT bundle and fitting curves.