[1] [1] WAN Yongjian, SHI Chunyan, WU Fan. Research on middle and high spatialfrequency errors by discrete particles abrasion［C］. SPIE, 2010, 7655: 765511-765515.

[2] [2] HARVEY J E, THOMPSON A K. Scattering effects from residual optical fabrication errors［C］. SPIE, 1995, 2576: 155-174.

[3] [3] YOUNGWORTH R N, STONE B D. Simple estimates for the effects of midspatialfrequency surface errors on image quality［J］. Applied Optics, 2000, 39(13): 2198-2209.

[4] [4] TAMKIN J M, MILSTER T D. Effects of structured midspatial frequency surface errors on image performance［J］. Applied Optics, 2010, 49(33): 6522-6536.

[5] [5] TAMKIN J M, DALLAS W J, MILSTER T D, Theory of pointspread function artifacts due to structured midspatial frequency surface errors［J］. Applied Optics, 2010, 49(33): 4814-4824.

[6] [6] CHEN Wei. Analysis of impact factors on frequency distribution of optic surface ［J］. Journal of Applied Optics, 2011, 32(5): 967-970.

[7] [7] HULL T, M. RISO J, BARENTINE J M, et al. Midspatial frequency matters: examples of the control of the power spectral density and what that means to the performance of imaging systems［C］. SPIE,2012, 8353: 835329-835329.

[8] [8] ZHOU Lin, DAI Yifan, XIE Xuhui. Frequency domain analysis in computer controlled optical surfacing［J］. Science China E, 2009, 39(3): 402-408.

[9] [9] BURGE J H, ANDERSON BENJAMIN B S, CHO M K, et al. Development of optimal grinding and polishing tools for aspheric surfaces［C］. SPIE, 2001, 4451: 153-164.

[10] [10] JONES R A. Computer simulation of smoothing during computercontrolled optical polishing［J］. Applied Optics, 1995, 34(7): 1162-1169.

[11] [11] CHEN Wei, YAO Hanmin, WU Fan, et al. Design of bandpass filters for the power spectral density analysis［J］. Acta Photonica Sinica, 2006, 35(1): 130-132.

[12] [12] ELSON J M, BENNETT J M. Calculation of the power spectral density from surface profile data［J］. Applied Opitics, 1995, 34(1): 201-208.

[13] [13] KIM D W, BURGE J H. Rigid conformal polishing tool using nonlinear viscoelastic effect［J］. Optical Express, 2010, 18(3): 2242-257.