Chinese Optics Letters, Volume. 15, Issue 5, 053101(2017)

Simultaneous measurements of s- and p-polarization reflectivity with a cavity ring-down technique employing no polarization optics

Hao Cui1,2, Bincheng Li1,2、*, Yanling Han2, Jing Wang1, Chunming Gao1, and Yafei Wang1
Author Affiliations
  • 1School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China
  • 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
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    References(27)

    [2] L. H. J. F. Beckmann, D. Ehrlichmann. Opt. Quantum. Electron., 27, 1407(1995).

    [6] . Optics and optical instruments-measurement of reflectance of plane surfaces and transmittance of plane parallel elements.

    [23] H. A. Macleod. Thin-Film Optical Filters(2001).

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    [1] Jin-Duo Wang, Jin Yu, Ze-Qiang Mo, Jian-Guo He, Shou-Jun Dai, Jing-Jing Meng, Xiao-Dong Wang, Yang Liu. Numerical methods of mode selection in continuous-wave cavity ring-down spectroscopy[J]. Acta Physica Sinica, 2019, 68(24): 244201-1

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    Hao Cui, Bincheng Li, Yanling Han, Jing Wang, Chunming Gao, Yafei Wang. Simultaneous measurements of s- and p-polarization reflectivity with a cavity ring-down technique employing no polarization optics[J]. Chinese Optics Letters, 2017, 15(5): 053101

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    Paper Information

    Category: Thin films

    Received: Dec. 4, 2016

    Accepted: Feb. 10, 2017

    Published Online: Jul. 23, 2018

    The Author Email: Bincheng Li (bcli@uestc.edu.cn)

    DOI:10.3788/COL201715.053101

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