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Photonics Research, Volume. 8, Issue 2, 110(2020)

Third-order nonlinear optical susceptibility of crystalline oxide yttria-stabilized zirconia

Guillaume Marcaud1、†,*, Samuel Serna1,2,6、†, Karamanis Panaghiotis3、†, Carlos Alonso-Ramos1, Xavier Le Roux1, Mathias Berciano1, Thomas Maroutian1, Guillaume Agnus1, Pascal Aubert1, Arnaud Jollivet1, Alicia Ruiz-Caridad1, Ludovic Largeau1, Nathalie Isac1, Eric Cassan1, Sylvia Matzen1, Nicolas Dubreuil4,5, Michel Rérat3, Philippe Lecoeur1, and Laurent Vivien1,7
Author Affiliations
  • 1Centre de Nanosciences et Nanotechnologies (C2N), Université-Paris-Sud, CNRS UMR 9001, Université Paris-Saclay, Orsay 91405, France
  • 2Current address: Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
  • 3Institut des Sciences Analytiques et de Physico-Chimie pour l’Environnement et les Matériaux, CNRS, Université de Pau et des Pays de l’Adour, 64053 Pau Cedex, France
  • 4Laboratoire Charles Fabry, Institut d’Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex, France
  • 5Current address: LP2N, Institut d’Optique Graduate School, CNRS, Univ. Bordeaux, 33400 Talence, France
  • 6Department of Physics, Bridgewater State University, Bridgewater, Massachusetts 02325, USA
  • 7e-mail: laurent.vivien@c2n.upsaclay.fr
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    Guillaume Marcaud, Samuel Serna, Karamanis Panaghiotis, Carlos Alonso-Ramos, Xavier Le Roux, Mathias Berciano, Thomas Maroutian, Guillaume Agnus, Pascal Aubert, Arnaud Jollivet, Alicia Ruiz-Caridad, Ludovic Largeau, Nathalie Isac, Eric Cassan, Sylvia Matzen, Nicolas Dubreuil, Michel Rérat, Philippe Lecoeur, Laurent Vivien. Third-order nonlinear optical susceptibility of crystalline oxide yttria-stabilized zirconia[J]. Photonics Research, 2020, 8(2): 110

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    Paper Information

    Category: Optical and Photonic Materials

    Received: Aug. 30, 2019

    Accepted: Nov. 9, 2019

    Published Online: Jan. 7, 2020

    The Author Email: Guillaume Marcaud (guillaume.marcaud@c2n.upsaclay.fr)

    DOI:10.1364/PRJ.8.000110

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology