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Journal of Atmospheric and Environmental Optics, Volume. 20, Issue 1, 114(2025)

Design of CMOS low light level imaging electronics system based on FPGA

ZHANG Wei1,2、* and YU Lei1
Author Affiliations
  • 1Optical Engineering Center, Anhui Institute of Optics and Fine Mechanics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China
  • 2University of Science and Technology of China, Hefei 230026, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (9)
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    References (10)
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    Figures & Tables(9)
    Diagram imaging system

    Fig. 1. Diagram imaging system

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    Spectral response for GSENSE400BSI

    Fig. 2. Spectral response for GSENSE400BSI

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    G400BSI driver block diagram

    Fig. 3. G400BSI driver block diagram

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    FPGA power supply unit

    Fig. 4. FPGA power supply unit

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    FPGA module block diagram

    Fig. 5. FPGA module block diagram

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    Camera control state machine

    Fig. 6. Camera control state machine

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    Align state machine. (a) Master state machine; (b) edge detection state machine

    Fig. 7. Align state machine. (a) Master state machine; (b) edge detection state machine

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    Results of imaging at different wavelength. (a) 670 nm; (b) 700 nm; (c) 740 nm

    Fig. 8. Results of imaging at different wavelength. (a) 670 nm; (b) 700 nm; (c) 740 nm

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    • Table 1. Image signal-to-noise ratio

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      Table 1. Image signal-to-noise ratio

      NumberMeanStdevRSN/dB
      13825.4105.331.20
      23827.7104.731.26
      33826.1103.531.36
      43826.8105.231.22
      53825.3106.231.13
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    Wei ZHANG, Lei YU. Design of CMOS low light level imaging electronics system based on FPGA[J]. Journal of Atmospheric and Environmental Optics, 2025, 20(1): 114

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    Paper Information

    Category:

    Received: Dec. 28, 2021

    Accepted: --

    Published Online: Feb. 21, 2025

    The Author Email: ZHANG Wei (kritoing@mail.ustc.edu.cn)

    DOI:10.3969/j.issn.1673-6141.2025.01.010

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology