Optics and Precision Engineering, Volume. 19, Issue 7, 1437(2011)
Measurement of large aperture SiC flat mirrors by oblique incidence interferometry
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LIU Zhao-dong, CHEN Lei, HAN Zhi-gang, YAN Qing-wei, ZHU Ri-hong. Measurement of large aperture SiC flat mirrors by oblique incidence interferometry[J]. Optics and Precision Engineering, 2011, 19(7): 1437
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Received: Sep. 13, 2010
Accepted: --
Published Online: Aug. 15, 2011
The Author Email: Zhao-dong LIU (liuzhaodong6@hotmail.com)