Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Electronics Optics & Control, Volume. 28, Issue 1, 10(2021)

Testing of Failure Mechanism Consistency Based on Principle of Acceleration Factor Constancy

SUO Bin1... TAN Qitao2, HU Tiansong1 and TANG Jiayin2 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    AbstractGet PDF
    Figures&Tables (0)
    Equations (0)
    References (3)
    Tools
    Paper Information
    Topics
    References(3)

    [1] [1] KIM S J, MUN B M, BAE S J.A cost-driven reliability demonstration plan based on accelerated degradation tests ［J］.Reliability Engineering and System Safety, 2018, 183:226-239.

    [2] [2] SUNG S.Optimal design of ramp-stress accelerated degradation tests based on the Wiener process ［J］.Microelectronics Reliability, 2019(113393):1-6.

    [4] [4] PIERUSCHKA E.Relation between lifetime distribution and the stress level causing failure, LMSD 800400［S］.Sunnyvale:Lockheed Missile and Space Division, 1961:1-30.

    Tools

    Get Citation

    Copy Citation Text

    SUO Bin, TAN Qitao, HU Tiansong, TANG Jiayin. Testing of Failure Mechanism Consistency Based on Principle of Acceleration Factor Constancy[J]. Electronics Optics & Control, 2021, 28(1): 10

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: Aug. 13, 2019

    Accepted: --

    Published Online: Aug. 26, 2021

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2021.01.003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology