Acta Optica Sinica, Volume. 28, Issue 6, 1096(2008)

Evaluation of Step Height Standard Using Nano-Measuring Machine Integrated with Focusing Sensor

Guo Tong*, Chen Jinping, Fu Xing, and Hu Xiaotang
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    References(4)

    [1] [1] A. Weckenmann, G. Peggs, J. Hoffmann. Probing systems for dimensional micro- and nano-metrology[J]. Meas. Sci. Technol., 2006, 17(3): 504~509

    [2] [2] R. Leach, J. Haycocks, K. Jackson et al.. Advances in traceable nanometrology at the national physical laboratory[J]. Nanotechnology, 2001, 12(1): 1~6

    [3] [3] J. A. Kramar. A nanometre resolution metrology with the molecular measuring machine[J]. Meas. Sci. Technol., 2005, 16(11): 2121~2128

    [5] [5] G. Jger, W. Schott, E. Manske et al.. Nanomeasuring technology-nano-measuring machine[A]. ASPE 2001 Annual Meeting, Washington D.C., Nov. 2001

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    Guo Tong, Chen Jinping, Fu Xing, Hu Xiaotang. Evaluation of Step Height Standard Using Nano-Measuring Machine Integrated with Focusing Sensor[J]. Acta Optica Sinica, 2008, 28(6): 1096

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 7, 2007

    Accepted: --

    Published Online: Jun. 6, 2008

    The Author Email: Tong Guo (guotong@tju.edu.cn)

    DOI:

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