Acta Photonica Sinica, Volume. 52, Issue 12, 1212004(2023)
Topography Measurement of Strongly Reflective Surfaces Based on Improved Automatic Multi-exposure and Digital Raster Projection Technology
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Jingfa LEI, Yin SUN, Miao ZHANG, Yongling LI, Ruhai ZHAO, Hong SUN. Topography Measurement of Strongly Reflective Surfaces Based on Improved Automatic Multi-exposure and Digital Raster Projection Technology[J]. Acta Photonica Sinica, 2023, 52(12): 1212004
Category: Instrumentation, Measurement and Metrology
Received: Apr. 24, 2023
Accepted: Jul. 20, 2023
Published Online: Feb. 19, 2024
The Author Email: ZHANG Miao (miao@ahjzu.edu.cn)