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High Power Laser and Particle Beams, Volume. 31, Issue 6, 63206(2019)

Device for uniformity calibration of high-intensity electromagnetic pulse radiation

Gao Yuan1...2,3, Qin Feng1,2,3, and Wu Shuang1,23 |Show fewer author(s)
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  • 1[in Chinese]
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  • 3[in Chinese]
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    [1] [1] Radasky W A, Baum C E, Wik M W. Introduction to the special issue on high-power electromagnetics (HEMP) and intentional electromagnetic interference (IEMI)［J］. IEEE Trans Elec-Mag Compact, 2004, 46(3): 314-321.

    [3] [3] Backstrom M G, Lovstrand K G. Susceptibility of electronic systems to high-power microwaves: summary of test experience［J］. IEEE Trans Elec-Mag Compact, 2004, 46(3): 396-403.

    [7] [7] IEC 61000-4-3, Electromagnetic compatibility (EMC)-Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test［S］.

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    Gao Yuan, Qin Feng, Wu Shuang. Device for uniformity calibration of high-intensity electromagnetic pulse radiation[J]. High Power Laser and Particle Beams, 2019, 31(6): 63206

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    Paper Information

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    Received: Feb. 27, 2019

    Accepted: --

    Published Online: Jun. 17, 2019

    The Author Email:

    DOI:10.11884/hplpb201931.190053

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology