Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Optoelectronics Letters, Volume. 17, Issue 5, 313(2021)

A lattice measuring method based on integral imaging technology

Xiao-dong ZHANG*... Suo-yin LI, Zhi-guo HAN, Lin ZHAO, Fa-guo LIANG and Ai-hua WU |Show fewer author(s)
Author Affiliations
  • Hebei Semiconductor Research Institute, Shijiazhuang 050051, China
    • show less
    Abstract
    Figures&Tables (0)
    Equations (0)
    References (12)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    ZHANG Xiao-dong, LI Suo-yin, HAN Zhi-guo, ZHAO Lin, LIANG Fa-guo, WU Ai-hua. A lattice measuring method based on integral imaging technology[J]. Optoelectronics Letters, 2021, 17(5): 313

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Received: Jun. 4, 2020

    Accepted: Aug. 13, 2020

    Published Online: Sep. 2, 2021

    The Author Email: Xiao-dong ZHANG (zxd_tju_edu@163.com)

    DOI:10.1007/s11801-021-0090-x

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology