Infrared and Laser Engineering, Volume. 48, Issue 3, 304001(2019)
Design of noise testing system for infrared detector in different bias voltages
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
Tian Guang, Xu Qing′an, Yang Yu, Lv Zhiqiang, Li Hui. Design of noise testing system for infrared detector in different bias voltages[J]. Infrared and Laser Engineering, 2019, 48(3): 304001
Paper Information
Category: 红外技术及应
Received: Oct. 13, 2018
Accepted: Nov. 22, 2018
Published Online: Apr. 6, 2019
The Author Email:
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20