Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai; Zhong Zhang; Jingtao Zhu; Xiaoqiang Wang; Jing Xu; Xiuhua Fu; Liang Bai; Qiushi Huang; Zhanshan Wang; Lingyan Chen

doi:10.3788/COL20090708.0738

Chinese Optics Letters, Volume. 7, Issue 8, 08738(2009)

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai^1,2, Zhong Zhang¹, Jingtao Zhu¹, Xiaoqiang Wang¹, Jing Xu¹, Xiuhua Fu², Liang Bai¹, Qiushi Huang¹, Zhanshan Wang¹, and Lingyan Chen¹

Author Affiliations

¹Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China

²Department of Physics, Changchun University of Science and Technology, Changchun 130022, China

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Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738

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Paper Information

Received: Nov. 5, 2008

Accepted: --

Published Online: Aug. 17, 2009

The Author Email:

DOI:10.3788/COL20090708.0738

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology