Acta Photonica Sinica, Volume. 31, Issue 1, 50(2002)

A NEW TYPE OF ATOMIC FORCE MICROSCOPE AND ITS APPLICATIONS

[in Chinese]... [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)
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    References(4)

    [1] [1] Binnig G,Rohrer H.Scanning tunneling microscope.Helev Phys Acta,1982,55(4):726~729

    [2] [2] Binnig G,Quate C F.Atomic force microscope.Phys Rev Lett,1986,56(5):930~935

    [5] [5] Zhang H J,Higuchi T,Nishioki N.Dual tunneling unit STM for length measurement based on crystalline lattice.J Vac Sci Technol(B),1997,15(1):174~179

    [6] [6] Zhang H J,Huang F,Higuchi T.Dual unit STM-AFM for length measurement based on reference scales.J Vac Sci Technol(B),1997,15(4):780~784

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A NEW TYPE OF ATOMIC FORCE MICROSCOPE AND ITS APPLICATIONS[J]. Acta Photonica Sinica, 2002, 31(1): 50

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    Received: May. 31, 2001

    Accepted: --

    Published Online: Sep. 18, 2007

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