Journal of Terahertz Science and Electronic Information Technology , Volume. 21, Issue 12, 1499(2023)

Research on differential chip sensitivity test based on pulsed current injection

DONG Yayun1, CUI Zhitong1, DU Chuanbao1, CHENG Yinhui1, NIE Xin1, WANG Wenzhuo2, and ZHENG Shengquan2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(5)

    [2] [2] BENFORD J,SWEGLE J A,SCHAMILOGLU E. High power microwaves[M]. 2nd ed. New York:Taylor & Francis, 2007.

    [4] [4] TROUT D H. Investigation of the bulk current injection technique by comparison to induced current from radiated electromagnetic fields[C]// IEEE International Symposium on Electromagnetic Compatibility, 1996.

    [5] [5] DEPARTMENT OF DEFENSE. High-altitude electromagnetic pulse(hemp) protection for ground-based c41 facilities performing critical, time-urgent missions. Part 1: fixed facilities: MIL-STD-188-125-1[S]. Washington, DC: Department of Defense, 1998.

    [11] [11] KALALAS C, ALONSO-ZARATE J. Lightweight and space-efficient vehicle authentication based on Cuckoo filter[C]// 2020 IEEE the 3rd 5G World Forum(5GWF). Bangalore,India:IEEE, 2020:139-144.

    [12] [12] ZHANG Han, ZHANG Dongmei, CHEN Hongfei, et al. Improving efficiency of pseudonym revocation in VANET using Cuckoo filter[C]// 2020 IEEE the 20th International Conference on Communication Technology. Nanning,China:IEEE, 2020:763-769.

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    DONG Yayun, CUI Zhitong, DU Chuanbao, CHENG Yinhui, NIE Xin, WANG Wenzhuo, ZHENG Shengquan. Research on differential chip sensitivity test based on pulsed current injection[J]. Journal of Terahertz Science and Electronic Information Technology , 2023, 21(12): 1499

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    Paper Information

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    Received: Aug. 2, 2021

    Accepted: --

    Published Online: Jan. 17, 2024

    The Author Email:

    DOI:10.11805/tkyda2021300

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