High Power Laser and Particle Beams, Volume. 31, Issue 5, 56006(2019)

Intelligent algorithm based simulation of track etching process on CR39 detector

Qi Wei... He Shukai and Gu Yuqiu |Show fewer author(s)
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    References(9)

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    [13] [13] Kodaira S, Yasuda N, Konishi T, et al. Calibration of CR-39 with atomic force microscope for the measurement of short range tracks from proton-induced target fragmentation reactions[J]. Radiation Measurements, 2013, 50:232-236.

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    Qi Wei, He Shukai, Gu Yuqiu. Intelligent algorithm based simulation of track etching process on CR39 detector[J]. High Power Laser and Particle Beams, 2019, 31(5): 56006

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    Paper Information

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    Received: Apr. 2, 2019

    Accepted: --

    Published Online: Jun. 10, 2019

    The Author Email:

    DOI:10.11884/hplpb201931.190088

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