Free-spectral-range-free filters with ultrawide tunability across the S + C + L band

Chunlei Sun; Chuyu Zhong; Maoliang Wei; Hui Ma; Ye Luo; Zequn Chen; Renjie Tang; Jialing Jian; Hongtao Lin; Lan Li

doi:10.1364/PRJ.420005

Photonics Research, Volume. 9, Issue 6, 1013(2021)

Free-spectral-range-free filters with ultrawide tunability across the S + C + L band

Chunlei Sun^1,2, Chuyu Zhong^3,4, Maoliang Wei^3,4, Hui Ma^3,4, Ye Luo^1,2, Zequn Chen^1,2, Renjie Tang^1,2, Jialing Jian^1,2, Hongtao Lin^3,4, and Lan Li^1,2、*

Author Affiliations

¹Key Laboratory of 3D Micro/Nano Fabrication and Characterization of Zhejiang Province, School of Engineering, Westlake University, Hangzhou 310024, China

²Institute of Advanced Technology, Westlake Institute for Advanced Study, Hangzhou 310024, China

³Key Laboratory of Micro-Nano Electronics and Smart System of Zhejiang Province, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China

⁴School of Microelectronics, Zhejiang University, Hangzhou 310027, China

show less

Cited By

Article index updated: Apr. 30, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 11 article(s) from Web of Science.

Tools

Get Citation

Copy Citation Text

Chunlei Sun, Chuyu Zhong, Maoliang Wei, Hui Ma, Ye Luo, Zequn Chen, Renjie Tang, Jialing Jian, Hongtao Lin, Lan Li. Free-spectral-range-free filters with ultrawide tunability across the S + C + L band[J]. Photonics Research, 2021, 9(6): 1013

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Integrated Optics

Received: Jan. 15, 2021

Accepted: Mar. 24, 2021

Published Online: May. 27, 2021

The Author Email: Lan Li (lilan@westlake.edu.cn)

DOI:10.1364/PRJ.420005

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology